EPEPS 2019: Montreal, Canada
IEEE
Tutorial IV
High-Speed LPDDR4X/5 Signal and Power Integrity advances in mobile and automotive memory systems

Sunil Gupta, Qualcomm Technologies, Inc.

This tutorial will focus on the Signal and Power integrity analysis of the LPDDR4X/5 memory system in mobile and automotive applications. All aspects of memory subsystem consisting of SoC, DRAM, PKG and PCB will be addressed. Topics covered will include SoC-DRAM PoP/External configurations, Co-SIPI analysis, frequency/time domain PDN analysis, SIPI in FOWLP advanced packaging, system timing budget and post-silicon validation, among others.

Sunil Gupta has over 20 years experience in semiconductor design and test. He obtained his Ph.D. in Electrical Engineering from The University of Texas at Austin. His areas of interest are Signal and Power integrity, Circuit Design and Silicon Validation. His work has resulted in patents, publications and presentations at premier conferences such as EPEPS, ECTC, EMC+SIPI and DesignCon